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× Scanning transmission electron microscopes
1 Study of site controlled quantum dot formation on focused ion beam patterned GaAs substrate [会议论文]
作者:Zhang, H.^1, Ross, I.M.^1, Walther, T.^1
关键词:Accelerating voltages;Cross sectional analysis;...
会议举办机构:Department of Electronic and Electrical Engineering, Mapping Building, University of Sheffield, Sheffield S1 3JD, United Kingdom^1
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作者:He, D.S.^1, Li, Z.Y.^1
关键词:Beam currents;Black level;...
会议举办机构:Nanoscale Physics Research Laboratory, School of Physics and Astronomy, University of Birmingham, Birmingham B15 2TT, United Kingdom^1
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作者:Lewis, E.A.^1;Page, R.C.^2;Binks, D.J.^3;等
关键词:Colloidal quantum dots;High-angle annular dark fields;...
会议举办机构:School of Materials, University of Manchester, M13 9PL Manchester, United Kingdom^1
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作者:Krivanek, Ondrej L.^1;Lovejoy, Tracy C.^1;Murfitt, Matthew F.^1;等
关键词:Energy resolutions;MeV energy;...
会议举办机构:Nion Co., 1102 8th St., Kirkland, WA 98033, United States^1
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作者:Lozano, J.G.^1;Guerrero-Lebrero, M.P.^2;Yasuhara, A.^3;等
关键词:Aberration-corrected;Atomic displacement;...
会议举办机构:Department of Materials, University of Oxford, OX1 3PH Oxford, United Kingdom^1
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作者:Slater, T.J.A.^1;Camargo, P.H.C.^2;Burke, M.G.^1;等
关键词:Analytical systems;Detector systems;...
会议举办机构:School of Materials, University of Manchester, M13 9PL Manchester, United Kingdom^1
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